Advanced Technology for Surface Profiling

 

We are pleased to announce that Top Seiko has introduced a surface profiler (MicroProf®200) made by the German company FRT.
This allows us to measure surface profiles and thickness variations (TTV) with high precision for sizes up to φ200.
The MicroProf®200 is equipped with advanced non-contact measurement technology, enabling highly accurate 3D surface scans. This precision tool enhances our capabilities in quality control and product development, ensuring that we meet the stringent requirements of industries such as aerospace, medical, and semiconductor.

For example, in a recent project involving semiconductor processing machine parts, the MicroProf®200 was utilized to measure the surface profiles and thickness variations of a precise component made from SiC plate.
The detailed 3D scans provided by the profiler allowed us to detect and analyze very fine surface irregularities and thickness variations.
With the ability to perform fast and reliable measurements, the MicroProf®200 significantly improves our efficiency and the consistency of our quality inspections. This addition to our equipment lineup demonstrates our commitment to investing in the latest technologies to better serve our clients.

For further information or technical support, please do not hesitate to contact us ! 
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Together, let’s shape the future of semiconductor technology with precision and innovation !